THE PEKING UNIVERSITY MULTI-APPLICATION ION BEAM ANALYSIS SYSTEM

Shen Dingyu，

Wang Xuemei

Nuclear Science and Techniques

pp.242-245

Published in print 01 Nov 1991

22300

A multi-application ion beam analysis system and some research projects performed at this system are described. The lifetime of the RF ion source for He^- is discussed.

TandemIon beam analysisRF ion source

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Gao Yuzhi et al., Chinese Journal of Semiconductors, 10 (1989), 537.