Technical report, Max-Planck Institute für Plasmaphysik, Garching, Germany, 1993: IPP 9/82

Angular distribution of sputtered atoms induced by low-energy heavy ion bombardment
The sputtering yield angular distributions have been calculated based on the ion energy dependence of total sputtering yields for Ni and Mo targets bombarded by low-energy Hg+ ion. The calculated curves show excellent agreement with the corresponding Wehner's experimental results of sputtering yield angular distribution. The fact clearly demonstrated the intrinsic relation between the ion energy dependence of total sputtering yields and the sputtering yield angular distribution. This intrinsic relation had been ignored in Yamamura's papers (1981,1982) due to some obvious mistakes.
Technical report, Max-Planck Institute für Plasmaphysik, Garching, Germany, 1993: IPP 9/82